• DocumentCode
    729111
  • Title

    Current challenges in component-level and system-level ESD simulation

  • Author

    Rosenbaum, Elyse ; Kuo-Hsuan Meng ; Yang Xiu ; Thomson, Nicholas

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2015
  • fDate
    26-29 May 2015
  • Firstpage
    333
  • Lastpage
    336
  • Abstract
    Electronic systems and components contain large numbers of elements and have a complex non-linear response to ESD; thus, passing ESD qualification on the first pass is unlikely to occur unless the robustness is verified by means of simulation prior to manufacturing. For component-level ESD verification, the primary challenge is in regards to computational efficiency; for system-level ESD verification, component and test bed modeling present major challenges.
  • Keywords
    electrostatic discharge; component-level ESD simulation; system-level ESD simulation; Computational modeling; Discharges (electric); Electrostatic discharges; Integrated circuit modeling; Pins; Solid modeling; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2015 Asia-Pacific Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-1-4799-6668-4
  • Type

    conf

  • DOI
    10.1109/APEMC.2015.7175328
  • Filename
    7175328