• DocumentCode
    729220
  • Title

    Read optimized MRAM with separate read-write paths based on concerted operation of magnetic tunnel junction with correlated material

  • Author

    Aziz, Ahmedullah ; Shukla, Nikhil ; Datta, Suman ; Gupta, Sumeet Kumar

  • Author_Institution
    Dept. of Electr. Eng., Pennsylvania State Univ., University Park, PA, USA
  • fYear
    2015
  • fDate
    21-24 June 2015
  • Firstpage
    43
  • Lastpage
    44
  • Abstract
    Summary form only given. We propose a technique based on connecting CM like VO2 in parallel with the MTJ in the read path of multi-port MRAMs. Utilizing insulator-metal transitions in CM, the proposed cell achieves 1.7X to 4.3X improvement in cell TMR (CTMR) along with 7% to 22% higher read disturb margin compared to a baseline cell. Due to the separation of read-write paths in multi-port MRAMs, the CM has no effect on the write operation. The proposed idea is not limited to VO2 and its benefits may be further enhanced by exploring other suitable CMs [6] or by tuning the properties like resistivities, critical currents and thermal stability by techniques like strain [7] or Cr doping [8].
  • Keywords
    MRAM devices; chromium; thermal stability; tunnelling magnetoresistance; CTMR; Cr; MTJ; baseline cell; cell tunnelling magnetoresistance; correlated material; insulator-metal transitions; magnetic tunnel junction; multiport MRAM; read disturb margin; read-write paths; thermal stability; write operation; Doping; Magnetic tunneling; Molecular beam applications; Molecular beam epitaxial growth; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2015 73rd Annual
  • Conference_Location
    Columbus, OH
  • Print_ISBN
    978-1-4673-8134-5
  • Type

    conf

  • DOI
    10.1109/DRC.2015.7175544
  • Filename
    7175544