DocumentCode
729322
Title
Demonstration of Ge CMOS inverter and ring oscillator with 10 nm ultra-thin channel
Author
Heng Wu ; Conrad, Nathan ; Mengwei Si ; Ye, Peide D.
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2015
fDate
21-24 June 2015
Firstpage
281
Lastpage
282
Abstract
In conclusion, we have demonstrated Ge CMOS devices with further scaled channel thickness of 10 nm. 9-stage ring oscillators are successfully realized. The channel thickness dependences of the devices behaviors are also studied and smaller Tch provides reduced SS and DIBL of MOSFETs and better voltage gain of CMOS inverters.
Keywords
CMOS integrated circuits; MOSFET; invertors; CMOS inverters; DIBL; Ge; MOSFET; ring oscillator; size 10 nm; ultra-thin channel; CMOS integrated circuits; Inverters; Logic gates; MOSFET circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2015 73rd Annual
Conference_Location
Columbus, OH
Print_ISBN
978-1-4673-8134-5
Type
conf
DOI
10.1109/DRC.2015.7175685
Filename
7175685
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