DocumentCode :
729628
Title :
A new MOCVD platform, prismo D-Blue™, for high-throughput GaN LED production
Author :
Quanyong Guo ; Hoo, Jason ; Iyechika, Yasushi ; Lion Wang ; Yingbin Liu ; Shiping Guo ; Zhiyou Du
Author_Institution :
Adv. Micro-Fabrication Equip. Inc. (AMEC), Shanghai, China
fYear :
2013
fDate :
10-12 Nov. 2013
Firstpage :
16
Lastpage :
20
Abstract :
A new MOCVD platform, the Prismo D-Blue™, was designed and manufactured at Advanced Micro-Fabrication Equipment Inc. (AMEC) for high-volume manufacturing of high-brightness Light Emitting Diodes (LEDs). The long- term process stability and repeatability were investigated and demonstrated. Based on a well-tuned laminar gas flow condition and very stable temperature control system using dual-wavelength pyrometer sensors, more than 52 LED production runs with repeated chip performance were achieved. The LED quick test data of LED brightness, wavelength and ESD show excellent repeatability for AMEC\´s Prismo D-Blue™ System. In addition, various graphite susceptor designs for 4" sapphire substrates were also investigated for good wafer uniformity. With different pocket depth for inner-ring and outer-ring, good susceptor (14×4" LED wafers) wavelength uniformity of <;1.6 nm was achieved.
Keywords :
III-V semiconductors; MOCVD; brightness; design engineering; gallium compounds; graphite; laminar flow; light emitting diodes; mechanical stability; microfabrication; pyrometers; wide band gap semiconductors; GaN; LED brightness; LED quick test data; MOCVD platform; Prismo D-Blue system; advanced microfabrication equipment inc; dual-wavelength pyrometer sensor; graphite susceptor design; high-brightness light emitting diode; high-throughput GaN LED production; high-volume manufacturing; long-term process repeatability; long-term process stability; repeated chip performance; sapphire substrate; very stable temperature control system; wafer uniformity; wavelength uniformity; well-tuned laminar gas flow condition; Brightness; Films; Gallium nitride; Periodic structures; Quantum well devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Lighting (ChinaSSL), 2013 10th China International Forum on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-2249-9
Type :
conf
DOI :
10.1109/SSLCHINA.2013.7177303
Filename :
7177303
Link To Document :
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