• DocumentCode
    729628
  • Title

    A new MOCVD platform, prismo D-Blue™, for high-throughput GaN LED production

  • Author

    Quanyong Guo ; Hoo, Jason ; Iyechika, Yasushi ; Lion Wang ; Yingbin Liu ; Shiping Guo ; Zhiyou Du

  • Author_Institution
    Adv. Micro-Fabrication Equip. Inc. (AMEC), Shanghai, China
  • fYear
    2013
  • fDate
    10-12 Nov. 2013
  • Firstpage
    16
  • Lastpage
    20
  • Abstract
    A new MOCVD platform, the Prismo D-Blue™, was designed and manufactured at Advanced Micro-Fabrication Equipment Inc. (AMEC) for high-volume manufacturing of high-brightness Light Emitting Diodes (LEDs). The long- term process stability and repeatability were investigated and demonstrated. Based on a well-tuned laminar gas flow condition and very stable temperature control system using dual-wavelength pyrometer sensors, more than 52 LED production runs with repeated chip performance were achieved. The LED quick test data of LED brightness, wavelength and ESD show excellent repeatability for AMEC\´s Prismo D-Blue™ System. In addition, various graphite susceptor designs for 4" sapphire substrates were also investigated for good wafer uniformity. With different pocket depth for inner-ring and outer-ring, good susceptor (14×4" LED wafers) wavelength uniformity of <;1.6 nm was achieved.
  • Keywords
    III-V semiconductors; MOCVD; brightness; design engineering; gallium compounds; graphite; laminar flow; light emitting diodes; mechanical stability; microfabrication; pyrometers; wide band gap semiconductors; GaN; LED brightness; LED quick test data; MOCVD platform; Prismo D-Blue system; advanced microfabrication equipment inc; dual-wavelength pyrometer sensor; graphite susceptor design; high-brightness light emitting diode; high-throughput GaN LED production; high-volume manufacturing; long-term process repeatability; long-term process stability; repeated chip performance; sapphire substrate; very stable temperature control system; wafer uniformity; wavelength uniformity; well-tuned laminar gas flow condition; Brightness; Films; Gallium nitride; Periodic structures; Quantum well devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Lighting (ChinaSSL), 2013 10th China International Forum on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-2249-9
  • Type

    conf

  • DOI
    10.1109/SSLCHINA.2013.7177303
  • Filename
    7177303