DocumentCode
729636
Title
Cause analysis on highly depreciated indoor LED product in CSA020
Author
Guangjun Lu ; Yuan, Cadmus ; Hongyu Tang ; Wong, Cell ; Xuejun Fan ; Zhang, G.Q.
Author_Institution
Beijing Res. Center, Delft Univ. of Technol., Beijing, China
fYear
2013
fDate
10-12 Nov. 2013
Firstpage
48
Lastpage
51
Abstract
With application of accelerated luminous depreciation test method of CSA020 which can reduce the lifetime test from 6,000 hours to less than 2,000 hours, LED lighting products with highly lumen depreciation or short lifetime can be easily screened out. Many potential factors can lead to that highly depreciation issue. This paper attempted to perform highly depreciation cause analysis by investigation on the activation energy Ea and junction temperature Tj of the highly depreciation of indoor LED products. Results were shown Ea of Product 4 is 0.29eV, even 0.09eV lower than the reference good product. Junction temperature Tj of Product 4 is 109deg.C, around 30deg.C higher than the reference good product, which means the junction temperature Tj is a key factor which caused highly depreciation. During lifetime design, both Ea and Tj are important and should be considered equally.
Keywords
LED lamps; life testing; CSA020; LED lighting products; accelerated luminous depreciation test method; activation energy; highly depreciated indoor LED product; highly depreciation cause analysis; highly lumen depreciation; junction temperature; lifetime test; Junctions; LED lamps; Lead; Life estimation; Standards;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Lighting (ChinaSSL), 2013 10th China International Forum on
Conference_Location
Beijing
Print_ISBN
978-1-4799-2249-9
Type
conf
DOI
10.1109/SSLCHINA.2013.7177311
Filename
7177311
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