• DocumentCode
    729636
  • Title

    Cause analysis on highly depreciated indoor LED product in CSA020

  • Author

    Guangjun Lu ; Yuan, Cadmus ; Hongyu Tang ; Wong, Cell ; Xuejun Fan ; Zhang, G.Q.

  • Author_Institution
    Beijing Res. Center, Delft Univ. of Technol., Beijing, China
  • fYear
    2013
  • fDate
    10-12 Nov. 2013
  • Firstpage
    48
  • Lastpage
    51
  • Abstract
    With application of accelerated luminous depreciation test method of CSA020 which can reduce the lifetime test from 6,000 hours to less than 2,000 hours, LED lighting products with highly lumen depreciation or short lifetime can be easily screened out. Many potential factors can lead to that highly depreciation issue. This paper attempted to perform highly depreciation cause analysis by investigation on the activation energy Ea and junction temperature Tj of the highly depreciation of indoor LED products. Results were shown Ea of Product 4 is 0.29eV, even 0.09eV lower than the reference good product. Junction temperature Tj of Product 4 is 109deg.C, around 30deg.C higher than the reference good product, which means the junction temperature Tj is a key factor which caused highly depreciation. During lifetime design, both Ea and Tj are important and should be considered equally.
  • Keywords
    LED lamps; life testing; CSA020; LED lighting products; accelerated luminous depreciation test method; activation energy; highly depreciated indoor LED product; highly depreciation cause analysis; highly lumen depreciation; junction temperature; lifetime test; Junctions; LED lamps; Lead; Life estimation; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Lighting (ChinaSSL), 2013 10th China International Forum on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-2249-9
  • Type

    conf

  • DOI
    10.1109/SSLCHINA.2013.7177311
  • Filename
    7177311