DocumentCode
730010
Title
Digitally-compatible ring oscillator frequency driven tuning of CN-TFT amplifiers: Performance compensation under statistical and morphological variations
Author
Banerjee, Suvadeep ; Gupta, Man Prakash ; Banerjee, Aritra ; Kumar, Satish ; Chatterjee, Abhijit
Author_Institution
Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2015
fDate
24-26 June 2015
Firstpage
1
Lastpage
6
Abstract
Carbon Nanotube network based Thin-Film Transistors (CN-TFTs) are excellent candidates for next generation flexible electronics applications. However CN-TFT circuits suffer from imperfections due to morphological variations of fabricated carbon nanotube geometries that cause wide performance variations in analog amplifiers built from these CN-TFTs. Improved fabrication methods and sophisticated process control techniques are not sufficient for tackling these imperfections. In this paper, a new digitally-compatible tuning method is proposed for CN-TFT based amplifier designs. The amplifier is placed in a ring-oscillator configuration using two additional digital inverters, appropriately modified to allow oscillation of the inverter-inverting amplifier-inverter configuration. The frequency of oscillation is then used to drive a tuning algorithm that recovers the performance of the amplifier under statistical and morphological fabrication process variations. The method is very easy to implement and simulation studies show excellent results.
Keywords
amplifiers; carbon nanotubes; invertors; oscillators; process control; thin film transistors; CN-TFT amplifiers; analog amplifiers; carbon nanotube geometry; carbon nanotube network; digital inverters; digitally-compatible ring oscillator; frequency driven tuning; inverter-inverting amplifier-inverter configuration; morphological variations; performance compensation; process control; statistical variations; thin-film transistors; Capacitors; Ring oscillators; Testing; Thin film transistors; Tuning; CN-TFT Circuits; Post-CMOS; Self-tuning;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed-Signal Testing Workshop (IMSTW), 2015 20th International
Conference_Location
Paris
Type
conf
DOI
10.1109/IMS3TW.2015.7177860
Filename
7177860
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