An approach to generate test signals for analog circuits — A control-theoretic perspective

Author

Vermeiren, Wolfgang ; Hopsch, Fabian ; Jancke, Roland

Author_Institution

Fraunhofer IIS/EAS, Dresden, Germany

fYear

2015

fDate

24-26 June 2015

Firstpage

1

Lastpage

6

Abstract

This paper presents a control-theoretic driven approach to the automatic generation of test signals for analog circuits or systems. It is based on the adaption of a tracking control structure for the task of generating test signals aimed at manufacturing test for a finished circuit design. The approach will be derived and its functionality is demonstrated using circuit examples. The integration of the proposed approach within a more general test development procedure for improving the fault coverage is explained.

Keywords

analogue circuits; integrated circuit design; signal generators; analog circuits; circuit design; control-theoretic driven approach; test signal generation; tracking control structure; Analog circuits; Band-pass filters; Circuit faults; Control systems; Control theory; Fault detection; Resistance; Automatic test signal generation; analog ATPG; analog circuit; analog fault simulation; control-theoretic derivation; fault detection; fault-model based test approach; improvement of fault coverage; network simulator; structural test; test development procedure; tracking control principle;

fLanguage

English

Publisher

ieee

Conference_Titel

Mixed-Signal Testing Workshop (IMSTW), 2015 20th International

Conference_Location

Paris

Type

conf

DOI

10.1109/IMS3TW.2015.7177868

Filename

7177868