DocumentCode :
732087
Title :
The Last Line Effect
Author :
Beller, Moritz ; Zaidman, Andy ; Karpov, Andrey
fYear :
2015
fDate :
18-19 May 2015
Firstpage :
240
Lastpage :
243
Abstract :
Micro-clones are tiny duplicated pieces of code, they typically comprise only a few statements or lines. In this paper, we expose the "last line effect," the phenomenon that the last line or statement in a micro-clone is much more likely to contain an error than the previous lines or statements. We do this by analyzing 208 open source projects and reporting on 202 faulty micro-clones.
Keywords :
Browsers; Chromium; Cloning; Computer languages; Open source software; Reliability; Code Clones; Defects; Last Line Effect; Last Statement Effect; Micro-clone;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Program Comprehension (ICPC), 2015 IEEE 23rd International Conference on
Conference_Location :
Florence, Italy
Type :
conf
DOI :
10.1109/ICPC.2015.34
Filename :
7181452
Link To Document :
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