DocumentCode
732748
Title
Hot electron schottky detection based on internal photoemission in silicon structures
Author
Desiatov, Boris ; Mazurski, Noa ; Shappir, Joseph ; Khurgin, Jacob B. ; Levy, Uriel
Author_Institution
Dept. of Appl. Phys., Hebrew Univ. of Jerusalem, Jerusalem, Israel
fYear
2015
fDate
10-15 May 2015
Firstpage
1
Lastpage
2
Abstract
We demonstrate the design, fabrication and characterization of plasmonic enhanced silicon photo-detector for infrared light. Theoretical model, experimental results and comparison between different geometric configurations will be presented and discussed.
Keywords
infrared detectors; integrated optics; optical design techniques; optical fabrication; optical testing; photodetectors; photoemission; plasmonics; silicon; Si; geometric configurations; hot electron Schottky detection; infrared light; internal photoemission; plasmonic enhanced silicon photo-detector characterization; plasmonic enhanced silicon photodetector design; plasmonic enhanced silicon photodetector fabrication; silicon structures; Detectors; Optical surface waves; Optical waveguides; Photonics; Silicon; Temperature measurement; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location
San Jose, CA
Type
conf
Filename
7183185
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