Title :
Beam deflection measurements of nondegenerate nonlinear refractive indices in direct-gap semiconductors
Author :
Peng Zhao ; Reichert, Matthew ; Ensley, Trenton R. ; Hagan, David J. ; Van Stryland, Eric W.
Author_Institution :
Coll. of Opt. & Photonics, Univ. of Central Florida, Orlando, FL, USA
Abstract :
We use the beam-deflection method to measure nondegenerate nonlinear refractive indices of ZnO and ZnSe and show, in agreement with theory, extremely nondegenerate nonlinear refraction is significantly larger than in the degenerate or near-degenerate case.
Keywords :
II-VI semiconductors; laser beams; optical Kerr effect; refractive index; wide band gap semiconductors; zinc compounds; ZnO; ZnSe; beam deflection measurements; direct-gap semiconductors; nondegenerate nonlinear refractive index; Dispersion; II-VI semiconductor materials; Nonlinear optics; Probes; Semiconductor device measurement; Zinc oxide;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
