Title :
Phase-inverted sidelobe-annihilated optical coherence tomography to break through the temporal diffraction limit
Author :
Chi Zhang ; Wong, Kenneth K. Y.
Author_Institution :
Wuhan Nat. Lab. for Optoelectron., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
Understand the tomography system as a temporal microscopy by space-time duality, a simple adjustment was performed on a conventional swept-source optical coherence tomography (SS-OCT), and achieved sharper resolution (~4 μm) for the single layer measurement.
Keywords :
biomedical optical imaging; optical microscopy; optical tomography; SS-OCT; conventional swept-source optical coherence tomography; phase-inverted sidelobe-annihilated optical coherence tomography; sharper resolution; single layer measurement; space-time duality; temporal diffraction limit; temporal microscopy; Image resolution; Microscopy; Optical diffraction; Optical imaging; Shape; Tomography;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2015 Conference on
Conference_Location :
San Jose, CA
