Material characterization de-embedding for rectangular to square waveguide

Material parameter extraction techniques require calibrated S-parameter data for accurate permittivity and permeability results. Calibration methods can be applied to remove systematic errors and to mathematically establish measurement reference planes at the face of a sample. A Thru-Reflect-Line (TRL) calibration method is typically employed in waveguide material parameter measurements to provide calibrated test data. Computational electromagnetic simulations of waveguide material measurements offer a controlled measurement environment and can be used to generate S-parameter data for material parameter extraction. This simulated data can be used as truth data and compared against measured test data to aid sample design and measurement verification. If calibration techniques are not appropriately implemented in simulation, the resulting S-parameter data can be impacted by features in the simulation and accuracy reduced. This paper demonstrates the usage of a TRL calibration in a material measurement simulation. The results show that a calibration process accounts for simulated systematic error and produces results that agree with measured test results.