• DocumentCode
    735281
  • Title

    Profiting from IoT: The key is very-large-scale happiness integration

  • Author

    Yano, Kazuo ; Akitomi, Tomoaki ; Ara, Koji ; Watanabe, Junichiro ; Tsuji, Satomi ; Sato, Nobuo ; Hayakawa, Miki ; Moriwaki, Norihiko

  • Author_Institution
    Research and Development Group, Hitachi, Ltd., Kokubunji, Tokyo, Japan
  • fYear
    2015
  • fDate
    17-19 June 2015
  • Abstract
    Big data without link to value is merely a cost. We have studied how to profit from data with Internet-of-Things technologies for over 10 years to reach the answer: the Wearable Happiness Meter. It allows us to integrate the measure of both wellbeing and productivity of 7-billion people worldwide, which was the dream of the 18th-century philosopher Jeremy Bentham, numeration of the greatest happiness of the greatest number to measure the right and wrong. Knowing right and wrong with the 10x speed over conventional financial feedback accelerates the growth of the enterprise, the economy, and the individual to maximize the worldwide happiness. Here the integration is not only on a chip, but in the distributed massive chips embedded in the society.
  • Keywords
    Big data; Indexes; Organizations; Productivity; Reliability; Wearable sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits (VLSI Circuits), 2015 Symposium on
  • Conference_Location
    Kyoto, Japan
  • Print_ISBN
    978-4-86348-502-0
  • Type

    conf

  • DOI
    10.1109/VLSIC.2015.7231287
  • Filename
    7231287