DocumentCode :
737651
Title :
Lift-off process of piezoelectric lead-zirconate-titanate thin film using self-assembled monolayer as sacrificial layer
Author :
Jian Lu ; Takagi, Hiroyuki ; Maeda, Ryutaro
Author_Institution :
Res. Center for Ubiquitous MEMS & Micro Eng. (UMEMSME), Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
Volume :
8
Issue :
3
fYear :
2013
fDate :
3/1/2013 12:00:00 AM
Firstpage :
138
Lastpage :
142
Abstract :
In this work, a hydrophobic self-assembled monolayer, perfluorodecyltrichlorosilane (FDTS) (CF3(CF2)7(CH2)2SiCl3), was proposed as a sacrificial layer for a lift-off process of a piezoelectric lead-zirconate-titanate (PZT) thin film on a Pt/Ti/SiO2/Si substrate. A FDTS fine pattern was firstly vapour deposited on a Pt/Ti/SiO2/Si substrate by a lift-off process, and then the PZT precursor was spin-coated on the Pt/Ti/SiO2/Si substrate, post-baked so the solvent decomposed and evaporated and annealed for crystallisation. The experimental results demonstrated that the super-hydrophobic FDTS with a contact angle of >120° is effective in preventing PZT crystallisation because of its thermal stability during PZT post-baking, and its barrier-effects between the spin-coated PZT precursor and the Pt/Ti substrate. After removing the FDTS and the PZT which is on top of the FDTS by a second lift-off process using ultrasonic agitation, a PZT fine pattern was successfully obtained on the Pt/Ti/SiO2/Si substrate with a thickness of 200-300 nm and feature size of a few tens of microns. In this Letter, the hydrophobic properties and surface morphology of different types of FDTS were studied and its barrier-effect on PZT crystallisation were analysed. The effects of PZT thickness in each spin-coating to lift-off the and PZT properties were investigated. The obtained PZT pattern was evaluated by an X-ray diffraction measurement.
Keywords :
X-ray diffraction; annealing; contact angle; crystallisation; evaporation; hydrophobicity; lead compounds; monolayers; piezoelectric thin films; self-assembly; spin coating; surface morphology; thermal stability; vapour deposition; PZT; Pt-Ti-SiO2-Si; Pt-Ti-silica-Si substrate; Si; X-ray diffraction measurement; XRD; annealing; barrier-effects; contact angle; hydrophobic properties; hydrophobic self-assembled monolayer; lead-zirconate-titanate crystallisation; lead-zirconate-titanate fine pattern; lead-zirconate-titanate post-baking; lead-zirconate-titanate properties; lead-zirconate-titanate thickness effects; lift-off process; perfluorodecyltrichlorosilane fine pattern; piezoelectric lead-zirconate-titanate thin film; sacrificial layer; size 200 nm to 300 nm; solvent decomposition; solvent evaporation; spin-coated lead-zirconate-titanate precursor; spin-coating; superhydrophobic perfluorodecyltrichlorosilane; surface morphology; thermal stability; ultrasonic agitation; vapour deposition;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2012.0888
Filename :
6544957
Link To Document :
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