DocumentCode
737712
Title
Device Scaling Considerations for Nanophotonic CMOS Global Interconnects
Author
Manipatruni, Sasikanth ; Lipson, Michal ; Young, Ian A.
Author_Institution
Components Res., Intel Corp., Hillsboro, OR, USA
Volume
19
Issue
2
fYear
2013
Firstpage
8200109
Lastpage
8200109
Abstract
We introduce an analytical framework to understand the path for scaling nanophotonic interconnects to meet the energy and footprint requirements of CMOS global interconnects. We derive the device requirements for sub-100 fJ/cm/bit interconnects including tuning power, serialization-deserialization energy, and optical insertion losses. Using CMOS with integrated nanophotonics as an example platform, we derive the energy/bit, linear, and areal bandwidth density of optical interconnects. We also derive the targets for device performance which indicate the need for continued improvements in insertion losses (<;8 dB), laser efficiency, operational speeds (>40 Gb/s), tuning power (<;100 μW/nm), serialization-deserialization (<;10 fJ/bit/Operation), and necessity for spectrally selective devices with wavelength multiplexing (>6 channels).
Keywords
CMOS integrated circuits; integrated optics; nanophotonics; optical interconnections; device performance; device scaling; laser efficiency; nanophotonic CMOS global interconnects; optical insertion losses; optical interconnects; serialization-deserialization energy; wavelength multiplexing; Bandwidth; CMOS integrated circuits; Detectors; Modulation; Optical interconnections; Optical waveguides; Tuning; Coupled resonators; integrated optics devices; integrated optoelectronic circuits; switching;
fLanguage
English
Journal_Title
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
1077-260X
Type
jour
DOI
10.1109/JSTQE.2013.2239262
Filename
6409381
Link To Document