Title :
Device Scaling Considerations for Nanophotonic CMOS Global Interconnects
Author :
Manipatruni, Sasikanth ; Lipson, Michal ; Young, Ian A.
Author_Institution :
Components Res., Intel Corp., Hillsboro, OR, USA
Abstract :
We introduce an analytical framework to understand the path for scaling nanophotonic interconnects to meet the energy and footprint requirements of CMOS global interconnects. We derive the device requirements for sub-100 fJ/cm/bit interconnects including tuning power, serialization-deserialization energy, and optical insertion losses. Using CMOS with integrated nanophotonics as an example platform, we derive the energy/bit, linear, and areal bandwidth density of optical interconnects. We also derive the targets for device performance which indicate the need for continued improvements in insertion losses (<;8 dB), laser efficiency, operational speeds (>40 Gb/s), tuning power (<;100 μW/nm), serialization-deserialization (<;10 fJ/bit/Operation), and necessity for spectrally selective devices with wavelength multiplexing (>6 channels).
Keywords :
CMOS integrated circuits; integrated optics; nanophotonics; optical interconnections; device performance; device scaling; laser efficiency; nanophotonic CMOS global interconnects; optical insertion losses; optical interconnects; serialization-deserialization energy; wavelength multiplexing; Bandwidth; CMOS integrated circuits; Detectors; Modulation; Optical interconnections; Optical waveguides; Tuning; Coupled resonators; integrated optics devices; integrated optoelectronic circuits; switching;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2013.2239262