Title :
A New Framework of Simultaneous-Fault Diagnosis Using Pairwise Probabilistic Multi-Label Classification for Time-Dependent Patterns
Author :
Chi-Man Vong ; Pak-Kin Wong ; Weng-Fai Ip
Author_Institution :
Dept. of Comput. & Inf. Sci., Univ. of Macau, Macau, China
Abstract :
Simultaneous-fault diagnosis is a common problem in many applications and well-studied for time-independent patterns. However, most practical applications are of the type of time-dependent patterns. In our study of simultaneous-fault diagnosis for time-dependent patterns, two key issues are identified: 1) the features of the multiple single faults are mixed or combined into one pattern which makes accurate diagnosis difficult, 2) the acquisition of a large sample data set of simultaneous faults is costly because of high number of combinations of single faults, resulting in many possible classes of simultaneous-fault training patterns. Under the assumption that the time-frequency features of a simultaneous fault are similar to that of its constituent single faults, these issues can be effectively resolved using our proposed framework combining feature extraction, pairwise probabilistic multi-label classification, and decision threshold optimization. This framework has been applied and verified in automotive engine-ignition system diagnosis based on time-dependent ignition patterns as a test case. Experimental results show that the proposed framework can successfully resolve the issues.
Keywords :
automotive components; engines; fault diagnosis; feature extraction; genetic algorithms; ignition; pattern classification; probability; automotive engine-ignition system diagnosis; decision threshold optimization; feature extraction; genetic algorithms; multiple single faults; pairwise probabilistic multilabel classification; simultaneous-fault diagnosis framework; simultaneous-fault training patterns; time-dependent ignition patterns; time-dependent patterns; time-frequency features; Accuracy; Feature extraction; Principal component analysis; Probabilistic logic; Support vector machine classification; Training; Vectors; Automotive applications; fault diagnosis; feature extraction; genetic algorithms (GA); ignition; internal combustion engines; multiple signal classification; principal component analysis (PCA); wavelet packets;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2012.2202358