DocumentCode :
739518
Title :
Design and Analysis of CMOS High-Speed High Dynamic-Range Track-and-Hold Amplifiers
Author :
Yu-Cheng Liu ; Hong-Yeh Chang ; Shu-Yan Huang ; Kevin Chen
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Jhongli, Taiwan
Volume :
63
Issue :
9
fYear :
2015
Firstpage :
2841
Lastpage :
2853
Abstract :
Design and analysis of two high-speed high dynamic-range track-and-hold amplifiers are presented in this paper using 65- and 90-nm CMOS processes. To achieve remarkable circuit performance in the advanced CMOS regime, the cascode topology with an inductive peaking technique and the distributed topology are employed in the track-and-hold amplifiers. The circuit topology is investigated to obtain the design methodology of the CMOS high-speed high dynamic-range track-and-hold amplifier. The theoretical calculation is presented to completely verify the design concept. Moreover, the proposed CMOS track-and-hold amplifiers demonstrate wide bandwidth and good linearity. With a dc power consumption of 197 mW, the 65-nm CMOS track-and-hold amplifier features an input bandwidth of up to 7 GHz, a spurious-free dynamic range (SFDR) of 44.6 dB, and a total harmonic distortion (THD) of -44.5 dB. With a dc power consumption of 216 mW, the 90-nm CMOS track-and-hold amplifier features an input bandwidth of 19 GHz, an SFDR of 47.5 dB, and a THD of -44.5 dB. The proposed CMOS track-and-hold amplifiers are suitable for the high-resolution high-speed analog-to-digital converter with low dc supply voltage and power.
Keywords :
CMOS integrated circuits; analogue-digital conversion; harmonic distortion; sample and hold circuits; CMOS process; DC power consumption; SFDR; THD; analog-to-digital converter; bandwidth 19 GHz; cascode topology; circuit topology; complementary metal oxide semiconductor; high-speed high dynamic-range track-and-hold amplifier; inductive peaking technique; power 197 mW; power 216 mW; size 65 nm; size 90 nm; spurious-free dynamic range; total harmonic distortion; Bandwidth; CMOS integrated circuits; Capacitance; Linearity; Logic gates; Switches; Switching circuits; CMOS; RF and mixed-signal integrated circuit (IC) design; RF front ends; high-speed analog CMOS design; sampling circuits;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.2015.2457434
Filename :
7175084
Link To Document :
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