DocumentCode :
739700
Title :
InAs Diodes Fabricated Using Be Ion Implantation
Author :
White, Benjamin S. ; Sandall, Ian C. ; David, John P. R. ; Chee Hing Tan
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
Volume :
62
Issue :
9
fYear :
2015
Firstpage :
2928
Lastpage :
2932
Abstract :
Be ion implantation and annealing conditions were optimized to demonstrate an effective method for selective area p-type doping in InAs. Optimized implantation and annealing conditions were subsequently utilized to produce planar InAs diodes. The Be implanted planar diodes had a superior dynamic resistance-area product and comparable dark current with n-i-p InAs mesa diodes when operated at low temperatures.
Keywords :
III-V semiconductors; annealing; indium compounds; ion implantation; semiconductor diodes; semiconductor doping; InAs; annealing conditions; ion implantation; planar diodes; Annealing; Dark current; Implants; Ion implantation; Schottky diodes; Temperature; Annealing; indium arsenide; ion implantation; photodiode; photodiode.;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2015.2456434
Filename :
7180358
Link To Document :
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