• DocumentCode
    740050
  • Title

    Determination of Energy and Charge Deposition Profiles in Elemental Slabs From an Isotropically Equivalent Electron Source Using Monte Carlo Simulations

  • Author

    Barton, David A. ; Beecken, Brian P. ; Hoglund, Robert M.

  • Author_Institution
    Air Force Research Laboratory, Kirtland Air Force Base, Albuquerque, NM, USA
  • Volume
    43
  • Issue
    9
  • fYear
    2015
  • Firstpage
    2861
  • Lastpage
    2868
  • Abstract
    Monte Carlo simulations using the MCNP5 transport code have been made for electrons with 10.0 keV to 5.0 MeV kinetic energies incident on thick slabs of elemental materials with atomic numbers in the range 6–79. An electron point source near the surface of the target slab was used to simulate isotropic incidence, allowing for the inclusion of backscatter and secondary-electron emissions in the simulation. Thus, the results should be uniquely useful for the modeling of deep-dielectric charging in spacecraft over a large range of energies and materials. Due to the minimum electron energy cutoff of MCNP5, accuracy of the simulations decreases at the lowest incident energies. A path has been identified for developing an algorithm that can quickly reproduce and interpolate between the Monte Carlo results for both incident energies and target materials in the ranges studied. Such an algorithm should prove useful to modelers of deep-dielectric charging in realistic spacecraft environments.
  • Keywords
    Aircraft manufacture; Backscatter; Data models; Dielectrics; Interpolation; Monte Carlo methods; Slabs; Charge deposition; Monte Carlo simulations; Monte Carlo simulations.; energy deposition; isotropic electron incidence;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2015.2461543
  • Filename
    7192635