• DocumentCode
    74156
  • Title

    Nearest Feature Line and Point Embedding for Hyperspectral Image Classification

  • Author

    Ya-fei Jia ; Yu-jian Li ; Peng-bin Fu ; Yun Tian

  • Author_Institution
    Coll. of Comput. Sci., Beijing Univ. of Technol., Beijing, China
  • Volume
    12
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    651
  • Lastpage
    655
  • Abstract
    Metric learning methods have been widely used in hyperspectral image (HSI) classification. They can project higher dimensional feature vectors to lower dimensional vectors and get more accurate classification results. Recently, nearest feature line (NFL) embedding (NFLE) algorithm has been proposed in HSI classification. This method tries to embed the distance between a point and its NFL. However, the decreasing of the point-to-line (P2L) distance does not mean that the point-to-point (P2P) distance decreases. In some cases, the P2P distance may even increase, which results in poor classification performance. In this letter, a modified algorithm of NFL and point embedding (NFLPE) is proposed for HSI analysis. Unlike NFLE, which just constrains the P2L distance, NFLPE also imposes an additional constraint on the P2P distance. This additional constraint avoids the possibility that when the P2L distance decreases, the P2P distance increases. Classification experiments with HSI demonstrate its superiority to other related techniques.
  • Keywords
    feature extraction; geophysical image processing; geophysical techniques; hyperspectral imaging; image classification; HSI analysis; NFLE algorithm; classification experiments; feature extraction; hyperspectral image classification; metric learning methods; nearest feature line; point embedding; point-to-line distance; Feature extraction; Hyperspectral imaging; Measurement; Principal component analysis; Training; Feature extraction; hyperspectral image (HSI); metric learning; supervised classification;
  • fLanguage
    English
  • Journal_Title
    Geoscience and Remote Sensing Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1545-598X
  • Type

    jour

  • DOI
    10.1109/LGRS.2014.2354678
  • Filename
    6901218