Title :
Exploiting Parallelism by Data Dependency Elimination: A Case Study of Circuit Simulation Algorithms
Author :
Wei Wu ; Fang Gong ; Krishnan, R. ; Lei He ; Hao Yu
Author_Institution :
Univ. of California, Los Angeles, Los Angeles, CA, USA
Abstract :
The authors present a methodology geared towards EDA applications such as parasitic extraction, transient circuit simulation, and RF steady-state simulations.
Keywords :
electronic design automation; parallel processing; EDA application; RF steady-state simulation; circuit simulation algorithm; data dependency elimination; electronic design automation; parallelism; parasitic extraction; transient circuit simulation; Algorithm design and analysis; Circuit simulation; Data processing; Integrated circuit modeling; Parallel processing; Program processors; Sparse matrices; Circuit Simulation; Data dependencies; Parallel Algorithms; Parallelism and concurrency;
Journal_Title :
Design & Test, IEEE
DOI :
10.1109/MDT.2012.2226201
