• DocumentCode
    742431
  • Title

    Skin-Effect Loss Models for Time- and Frequency-Domain PEEC Solver

  • Author

    Ruehli, Albert E. ; Antonini, Giulio ; Li Jun Jiang

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • Volume
    101
  • Issue
    2
  • fYear
    2013
  • Firstpage
    451
  • Lastpage
    472
  • Abstract
    A challenging and interesting issue for the solution of large electromagnetic problems is the efficient, sufficiently accurate modeling of the broadband skin-effect loss for conducting planes and 3-D shapes. The inclusion of such models in an electromagnetic (EM) solver can be very costly in compute time and memory requirements. These issues are particularly important for the class of signal, power, and noise integrity (NI) problems. In this paper, we concentrate on partial element equivalent circuit (PEEC)-type methods which are suitable for the solution of this class of problems. Progress has been made recently in the design of skin-effect models. The difficult issues are broadband frequency-domain or time-domain problems. These models are considered in this paper. We present several solution methods, and we compare results obtained with these approaches.
  • Keywords
    computational electromagnetics; conducting materials; equivalent circuits; frequency-domain analysis; losses; skin effect; time-domain analysis; 3D shapes; broadband skin-effect loss; conducting planes; electromagnetic solver; frequency-domain PEEC solver; large electromagnetic problems; partial element equivalent circuit type methods; skin effect loss models; time-domain PEEC solver; Computational modeling; Conductors; Integral equations; Integrated circuit modeling; Mathematical model; Solid modeling; Surface impedance; Modified nodal analysis (MNA); noise integrity (NI); partial element equivalent circuit (PEEC); power integrity (PI); signal integrity (SI); transmission line (TL);
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/JPROC.2012.2220312
  • Filename
    6353491