Wideband and Compact TE-Pass/TM-Stop Polarizer Based on a Hybrid Plasmonic Bragg Grating for Silicon Photonics

Author

Jihua Zhang ; Cassan, Eric ; Xinliang Zhang

Author_Institution

Wuhan Nat. Lab. for Optoelectonics, Huazhong Univ. of Sci. & Technol., Wuhan, China

Volume

32

Issue

7

fYear

2014

fDate

1-Apr-14

Firstpage

1383

Lastpage

1386

Abstract

Based on a transverse electric (TE)/transverse magnetic (TM) polarization diversity waveguide, we theoretically propose a TE-pass/TM-stop polarizer by etching a polarization dependent Bragg grating into the oxide layer of a silicon/thin SiO₂ gap/metal cap hybrid plasmonic waveguide. The simulation results indicate that the device is characterized by high TE-transmission and large TM-reflection levels in a wide waveband from 1.48 to 1.7 μm combined with an excellent compactness (length less than 5 μm). Transmission and reflection extinction ratio are both larger than 17.1 dB in the 1.48-1.64 μm wavelength range, while losses are smaller than 1.36 and 0.69 dB for the TE and TM modes, respectively.

Keywords

Bragg gratings; elemental semiconductors; etching; infrared spectra; light polarisation; optical losses; optical polarisers; optical waveguides; plasmonics; silicon; silicon compounds; Si-SiO₂; TE modes; TE-transmission; TM modes; TM-reflection levels; compact TE-pass-TM-stop polarizer; etching; hybrid plasmonic Bragg grating; oxide layer; polarization dependent Bragg grating; reflection extinction ratio; silicon photonics; silicon-thin SiO₂ gap-metal cap hybrid plasmonic waveguide; transmission extinction ratio; transverse electric-transverse magnetic polarization diversity waveguide; wavelength 1.48 mum to 1.7 mum; wideband TE-pass-TM-stop polarizer; Bragg gratings; Gratings; Metals; Optimized production technology; Plasmons; Reflection; Silicon; Bragg grating; hybrid plasmonic waveguide (HPW); polarization diversity; polarizer; silicon photonics; surface plasmons;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/JLT.2014.2302304

Filename

6720195