Title :
Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking
Abstract :
Presents a prolog to the article, "Overview of Beyond-CMOS Devices and a Uniform Methodology for Their Benchmarking".
Keywords :
CMOS integrated circuits; integrated circuit testing; semiconductor technology; technological forecasting; CMOS devices; device benchmarking; uniform methodology; Adders; Benchmark testing; CMOS technology; Integrated circuits; Nanoelectronics; Power dissipation; Semiconductor devices; Special issues and sections; Throughput;
Journal_Title :
Proceedings of the IEEE
DOI :
10.1109/JPROC.2013.2286655
