• DocumentCode
    743345
  • Title

    Stability Analysis of a Planar Multiple-Beam Circuit for W -Band High-Power Extended-Interaction Klystron

  • Author

    Suye Lu ; Changqing Zhang ; Shuzhong Wang ; Yong Wang

  • Author_Institution
    Univ. of Chinese Acad. of Sci., Beijing, China
  • Volume
    62
  • Issue
    9
  • fYear
    2015
  • Firstpage
    3042
  • Lastpage
    3048
  • Abstract
    Circuit analysis of a multiple-beam version of a high-power extended-interaction klystron is performed. The circuit is based on the barbell cavity with five coplanar electron beams across the transverse section of the cavity. Although the basic circuit design is straightforward, stable operation is challenging due to the mode competition and the self-oscillation in an oversized multiple-gap cavity driven by multiple beam sources. The 3-D particle-in-cell (PIC) simulation technology and the space-charge wave theory were exploited to analyze the stability. The physical design of the interaction system was accomplished with the beam parameters of voltage 19 kV and of overall current 4 A (0.8 A × 5). PIC results show that a power of 11.28 kW can be achieved at a frequency of 94.48 GHz with an instantaneous 3-dB bandwidth of 160 MHz. The corresponding gain and electric efficiency are 55.75 dB and 14.84%, respectively.
  • Keywords
    electron beams; klystrons; millimetre wave tubes; space charge waves; stability; 3-D particle-in-cell; PIC simulation technology; W-band high-power extended-interaction klystron; bandwidth 160 MHz; barbell cavity; circuit analysis; coplanar electron beam; current 4 A; efficiency 14.84 percent; frequency 94.48 GHz; gain 55.75 dB; multiple beam source; multiple-gap cavity; planar multiple-beam circuit; power 11.28 kW; self-oscillation; space-charge wave theory; stability analysis; voltage 19 kV; Cavity resonators; Circuit stability; Couplings; Electron beams; Integrated circuit modeling; Oscillators; Stability analysis; Barbell cavity; extended-interaction klystron (EIK); mode competition; particle-in-cell (PIC) simulation; planar multiple beams; planar multiple beams.;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2435031
  • Filename
    7118171