• DocumentCode
    746548
  • Title

    Measuring satellite antennas with a compact hologram test range

  • Author

    Säily, Jussi ; Ala-Laurinaho, Juha ; Häkli, Janne ; Koskinen, Tomi ; Lönnqvist, Anne ; Raisanen, Antti V. ; Tuovineni, Jussi

  • Author_Institution
    Radio Lab., Helsinki Univ. of Technol., Finland
  • Volume
    17
  • Issue
    5
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    13
  • Lastpage
    19
  • Abstract
    Testing of satellite antennas at high millimeter and submillimeter wavelengths has some specific problems not encountered at lower frequencies. The atmospheric attenuation due to water and oxygen molecule resonances at certain frequency bands can be substantial. Therefore, conventional far-field test methods for electrically large antennas are ruled out by the required far-field distance of kilometers or even tens of kilometers. However, the compact antenna test range (CATR) makes such far-field tests possible within an indoor chamber having a controlled atmosphere. The application and ongoing development of a CATR based on a hologram as the focusing element are outlined
  • Keywords
    antenna radiation patterns; antenna testing; holographic optical elements; millimetre wave antennas; reflector antennas; satellite antennas; submillimetre wave antennas; Odin satellite; antenna far-field pattern; artificial plane wave; binary amplitude hologram; compact antenna test range; compact hologram test range; controlled atmosphere; electrically large radiotelescopes; far-field tests; hologram focusing element; indoor chamber; millimeter wavelengths; oxygen molecule resonances; planar near-field scanner; quiet-zone fields; satellite antenna testing; submillimeter wavelengths; transmission-type device; water atmospheric attenuation; Antenna measurements; Atmosphere; Atmospheric measurements; Atmospheric waves; Attenuation; Resonance; Resonant frequency; Satellite antennas; Testing; Wavelength measurement;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0885-8985
  • Type

    jour

  • DOI
    10.1109/62.1001987
  • Filename
    1001987