DocumentCode
7470
Title
Evaluating Neutron Induced SEE in SRAM-Based FPGA Protected by Hardware- and Software-Based Fault Tolerant Techniques
Author
Azambuja, Jose Rodrigo ; Nazar, Gabriel ; Rech, P. ; Carro, Luigi ; Lima Kastensmidt, Fernanda ; Fairbanks, Tom ; Quinn, Heather
Author_Institution
Centro de Cienc. Computacionais, Univ. Fed. do Rio Grande (FURG), Porto Alegre, Brazil
Volume
60
Issue
6
fYear
2013
fDate
Dec. 2013
Firstpage
4243
Lastpage
4250
Abstract
This paper presents an approach to detect SEEs in SRAM-based FPGAs by using software-based techniques combined with a nonintrusive hardware module. We implemented a MIPS-based soft-core processor in a Virtex5 FPGA and hardened it with software- and hardware-based fault tolerance techniques. First fault injection in the configuration memory bitstream was performed in order to verify the feasibility of the proposed approach, detection rates and diagnosis. Furthermore a neutron radiation experiment was performed at LANSCE. Results demonstrate the possibility of employing more flexible fault tolerant techniques to SRAM-based FPGAs with a high detection rate. Comparisons between bitstream fault injection and radiation test is also presented.
Keywords
SRAM chips; fault tolerance; field programmable gate arrays; radiation hardening (electronics); LANSCE; MIPS-based soft-core processor; SRAM-based FPGA; Virtex5 FPGA; bitstream fault injection; configuration memory bitstream; detection rates; hardware-based fault tolerant technique; neutron radiation experiment; neutron-induced SEE evaluation; nonintrusive hardware module; radiation test; software-based fault tolerant technique; Circuit faults; Fault tolerance; Field programmable gate arrays; Hardware; Microprocessors; Single event transients; Single event upsets; Fault tolerance; hybrid fault tolerance techniques; microprocessors; single event effects (SEEs);
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2013.2288305
Filename
6678297
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