Title :
Field Programmability of Supply Voltages for FPGA Power Reduction
Author :
Li, Fei ; Lin, Yan ; He, Lei
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA
fDate :
4/1/2007 12:00:00 AM
Abstract :
Power reduction is of growing importance for field-programmable gate arrays (FPGAs). In this paper, we apply programmable supply voltage (Vdd) to reduce FPGA power. We first design FPGA logic fabrics using dual-Vdd levels and show that field-programmable power supply is required to obtain a satisfactory power-versus-performance tradeoff. We further design FPGA interconnect fabrics for fine-grained Vdd programmability with minimal increase of the number of configuration static-random-access-memory cells. With a simple yet practical computer-aided design flow to leverage the field-programmable dual-Vdd logic and interconnect fabrics, we carry out a highly quantitative study using placed and routed benchmark circuits, and delay, power, and area models obtained from detailed circuit designs. Compared to single-Vdd FPGAs with the Vdd level suggested by the International Technology Roadmap for Semiconductors for 100-nm technology, field-programmable dual-Vdd FPGAs reduce the total power by 47.61% and the energy-delay product by 27.36%
Keywords :
circuit CAD; field programmable gate arrays; integrated circuit design; network routing; power supply circuits; 100 nm; FPGA power reduction; International Technology Roadmap for Semiconductors; computer-aided design; configuration static-random-access-memory cells; field programmability; field-programmable gate arrays; fine-grained voltage programmability; logic fabrics; placed benchmark circuits; power-versus-performance tradeoff; routed benchmark circuits; supply voltages; Circuit synthesis; Delay; Design automation; Fabrics; Field programmable gate arrays; Integrated circuit interconnections; Logic circuits; Logic design; Power supplies; Voltage; Dual Vdd; field-programmable gate array (FPGA) architecture; p ower reduction; supply-voltage programmability;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2006.884848