Title :
Linear frequency dependence in AC resistance measurement
Author :
Schurr, Jürgen ; Wood, Barry M. ; Overney, Frédéric
Author_Institution :
Phys.-Technische Bundesanstalt, Braunschweig, Germany
fDate :
4/1/2005 12:00:00 AM
Abstract :
The frequency dependence of AC resistors as well as the AC quantum Hall resistance shows sometimes unexpected linear terms of the order of 1·10-7 kHz-1. Three reasons for measuring linear terms are identified as systematic effects of the coaxial bridge and the compared resistors.
Keywords :
electric resistance measurement; quantum Hall effect; resistors; AC quantum Hall resistance; AC resistance measurement; AC resistors; calculable AC-DC resistor; coaxial AC bridge; current equalizer; linear frequency dependence; systematic effects; Bridges; Coaxial components; Conductors; Electrical resistance measurement; Equalizers; Frequency dependence; Hall effect; Impedance; Metrology; Resistors; AC quantum Hall effect; calculable ac-dc resistor; coaxial ac bridge; current equalizer;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2005.843583
