• DocumentCode
    747771
  • Title

    2.6-V high-resolution programmable Josephson voltage standard circuits using double-stacked MoSi2-barrier junctions

  • Author

    Chong, Yonuk ; Burroughs, C. Harles J, Jr. ; Dresselhaus, Paul D. ; Hadacek, Nicolas ; Yamamori, Hirotake ; Benz, Samuel P.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    54
  • Issue
    2
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    616
  • Lastpage
    619
  • Abstract
    Using a new circuit design and double-stacked junction technology we have demonstrated fully functional high-resolution programmable voltage standard chips with 67 410 junctions that operate up to a maximum output voltage of 2.6 V. The circuit uses double-stacked junctions, where two junctions are fabricated in each stack, in order to increase the output voltage. We have also improved the voltage resolution at fixed frequencies 16-fold by using a circuit optimized for three voltage states and 128-fold below 2 V by oppositely biasing two large arrays whose junction counts differ by a single stack. These circuits operate over a frequency range from 14 GHz to 19 GHz with a 2-mA maximum operating current range.
  • Keywords
    Josephson effect; measurement standards; microwave circuits; molybdenum compounds; programmable circuits; superconductor-normal-superconductor devices; voltage measurement; 14 to 19 GHz; 2 mA; 2.6 V; Josephson arrays; MoSi2; circuit design; double-stacked -barrier junctions; double-stacked junction; high-resolution Josephson voltage standard; programmable Josephson voltage standard; superconductor-normal-superconductor; voltage resolution; voltage standard chips; Circuit synthesis; Critical current; Frequency response; Josephson junctions; NIST; Quantization; Reproducibility of results; Superconducting devices; Synthesizers; Voltage; Josephson arrays; quantization; standards; superconductor-normal-superconductor (SNS);
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2004.843080
  • Filename
    1408247