Manipulating single electrons with a seven-junction pump

Author

Hof, Christian ; Jeanneret, Blaise ; Eichenberger, Ali ; Overney, Frédéric ; Keller, Mark W. ; Dalberth, M.J.

Author_Institution

Swiss Fed. Office of Metrol. & Accreditation, Bern, Switzerland

Volume

54

Issue

2

fYear

2005

fDate

4/1/2005 12:00:00 AM

Firstpage

670

Lastpage

672

Abstract

In this paper, the operation of a seven-junction electron pump is presented. To characterize the pump, a single-electron tunneling transistor capacitively coupled to the pump was used. With this device, single electrons were manipulated one at a time. By performing electron pumping at a frequency of 1 MHz, an error rate of (4±1)×10^-5 was determined. This preliminary result is a solid milestone on the way to the capacitance standard presently under development at the Swiss Federal Office of Metrology and Accreditation.

Keywords

Coulomb blockade; capacitance measurement; measurement standards; single electron transistors; tunnelling; 1 MHz; Coulomb blockade; Swiss Federal Office of Metrology and Accreditation; capacitance standard; electrical metrology; electron pumping; seven-junction electron pump; single-electron devices; single-electron tunneling transistor; Accreditation; Current measurement; Error analysis; Frequency; Metrology; NIST; Quantum capacitance; Single electron transistors; Standards development; Tunneling; Accuracy; Coulomb blockade; electrical metrology; electron pump; electron transistor; single-electron devices;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2004.843066

Filename

1408260