DocumentCode
747950
Title
Uncertainty of VNA S-parameter measurement due to nonideal TRL calibration items
Author
Stumper, Ulrich
Author_Institution
Phys. Tech. Bundesanstalt, Braunschweig, Germany
Volume
54
Issue
2
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
676
Lastpage
679
Abstract
For the 7-term TRL calibration of a four-sampler vector network analyzer (VNA), expressions for the deviations of the S-parameters of two-port test objects are presented as functions of the deviations from the ideal values of the S-parameters of the TRL standards used. The sensitivity coefficients obtained are suitable for establishing the Type-B uncertainty budget for the S-parameter measurement.
Keywords
S-parameters; calibration; measurement uncertainty; network analysers; sensitivity; two-port networks; S-parameter measurement; TRL standards; measurement uncertainty; nonideal TRL calibration; sensitivity coefficients; two-port test objects; vector network analyzer; Calibration; Impedance; Measurement standards; Measurement uncertainty; Microprogramming; Performance analysis; Performance evaluation; Reflection; Scattering parameters; Testing; 7-term TRL calibration; S-parameters; sensitivity coefficients; uncertainty of calibration; uncertainty of measurement; vector network analyzer;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2005.843521
Filename
1408262
Link To Document