Timing Jitter Characterization for Mixed-Signal Production Test Using the Interpolation Algorithm

Author

Xia, Tian ; Zheng, Hao

Author_Institution

Sch. of Eng., Vermont Univ., Burlington, VT

Volume

54

Issue

2

fYear

2007

fDate

4/1/2007 12:00:00 AM

Firstpage

1014

Lastpage

1023

Abstract

In this paper, a jitter measurement circuit for mixed-signal production test based on the interpolation algorithm is presented. By utilizing the limited sampling points per cycle, the original signal under test is reconstructed with a high accuracy. From the reconstructed signal, most timing jitter features can be characterized. To validate the design effectiveness, comparative studies have been performed between this jitter measurement method and other standard jitter characterization instruments

Keywords

automatic test equipment; integrated circuit design; integrated circuit measurement; integrated circuit testing; interpolation; mixed analogue-digital integrated circuits; production testing; signal reconstruction; timing jitter; interpolation algorithm; measurement circuit; mixed-signal production test; sampling points; signal reconstruction; standard jitter characterization instruments; timing jitter; Built-in self-test; Circuit testing; Delay; Electronics industry; Instruments; Integrated circuit testing; Interpolation; Production; Sampling methods; Timing jitter; Interpolation algorithm; mixed signal; production test; timing jitter;

fLanguage

English

Journal_Title

Industrial Electronics, IEEE Transactions on

Publisher

ieee

ISSN

0278-0046

Type

jour

DOI

10.1109/TIE.2007.892257

Filename

4135425