DocumentCode
748271
Title
Electrical Properties of Silicon in UHV: Two Experiments for Undergraduates
Author
Nuss, Ray ; Burton, Larry C.
Volume
16
Issue
4
fYear
1973
Firstpage
192
Lastpage
194
Abstract
Two instructional experiments related to the temperature dependence of the electrical conductivity and to the thermionic emission properties of single crystal silicon have been performed in ultra-high vacuum. The measurements are straightforward, using standard electronic components, and can be successfully completed by senior electrical engineering students in one semester. The experiments form a good introduction for undergraduate students who expect to do further work in areas related to semiconductors and/or ultra-high vacuum.
Keywords
Cathodes; Conductivity measurement; Electric variables measurement; Electrical engineering; Laboratories; Silicon; Steel; Temperature dependence; Temperature measurement; Thermionic emission;
fLanguage
English
Journal_Title
Education, IEEE Transactions on
Publisher
ieee
ISSN
0018-9359
Type
jour
DOI
10.1109/TE.1973.4320847
Filename
4320847
Link To Document