• DocumentCode
    748271
  • Title

    Electrical Properties of Silicon in UHV: Two Experiments for Undergraduates

  • Author

    Nuss, Ray ; Burton, Larry C.

  • Volume
    16
  • Issue
    4
  • fYear
    1973
  • Firstpage
    192
  • Lastpage
    194
  • Abstract
    Two instructional experiments related to the temperature dependence of the electrical conductivity and to the thermionic emission properties of single crystal silicon have been performed in ultra-high vacuum. The measurements are straightforward, using standard electronic components, and can be successfully completed by senior electrical engineering students in one semester. The experiments form a good introduction for undergraduate students who expect to do further work in areas related to semiconductors and/or ultra-high vacuum.
  • Keywords
    Cathodes; Conductivity measurement; Electric variables measurement; Electrical engineering; Laboratories; Silicon; Steel; Temperature dependence; Temperature measurement; Thermionic emission;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/TE.1973.4320847
  • Filename
    4320847