DocumentCode :
748288
Title :
Radiation response of optically-triggered GaAs thyristors
Author :
Carson, R.F. ; Hughes, R.C. ; Zipperian, T.E. ; Weaver, H.T. ; Brennan, T.M. ; Hammons, B.E. ; Klem, J.F.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Volume :
36
Issue :
6
fYear :
1989
fDate :
12/1/1989 12:00:00 AM
Firstpage :
2147
Lastpage :
2154
Abstract :
Gallium arsenide optically triggered thyristors that exhibit tolerance to high X-ray dose rates have been fabricated. These two-terminal epitaxial devices feature breakover voltages of 18 V to 38 V with no radiation. They trigger at less than 2 V with only tenths of a milliwatt of laser light, but they do not trigger at 2×109 rad(Si)/s with a bias level as much as 40% to 60% of the zero-radiation breakover voltage. When these devices are bombarded with neutrons, the reduced carrier lifetimes result in a decreased sensitivity to triggering by light and ionizing radiation. The thyristors show some decrease in optical and X-ray sensitivity upon neutron exposure in excess of 1013 n/cm2. At 10 14 n/cm2, there are major reductions in photon sensitivity, and some instability is observed
Keywords :
III-V semiconductors; X-ray effects; carrier lifetime; gallium arsenide; neutron effects; semiconductor device testing; thyristors; 18 to 38 V; X-ray sensitivity; breakover voltages; carrier lifetimes; high X-ray dose rates; ionizing radiation; laser light; neutron exposure; optically triggered GaAs thyristors; photon sensitivity; radiation response; semiconductor; two-terminal epitaxial devices; Absorption; Charge carrier lifetime; Gallium arsenide; Ionizing radiation; Laboratories; Neutrons; Optical switches; Photoconductivity; Thyristors; Voltage;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.45417
Filename :
45417
Link To Document :
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