• DocumentCode
    748288
  • Title

    Radiation response of optically-triggered GaAs thyristors

  • Author

    Carson, R.F. ; Hughes, R.C. ; Zipperian, T.E. ; Weaver, H.T. ; Brennan, T.M. ; Hammons, B.E. ; Klem, J.F.

  • Author_Institution
    Sandia Nat. Lab., Albuquerque, NM, USA
  • Volume
    36
  • Issue
    6
  • fYear
    1989
  • fDate
    12/1/1989 12:00:00 AM
  • Firstpage
    2147
  • Lastpage
    2154
  • Abstract
    Gallium arsenide optically triggered thyristors that exhibit tolerance to high X-ray dose rates have been fabricated. These two-terminal epitaxial devices feature breakover voltages of 18 V to 38 V with no radiation. They trigger at less than 2 V with only tenths of a milliwatt of laser light, but they do not trigger at 2×109 rad(Si)/s with a bias level as much as 40% to 60% of the zero-radiation breakover voltage. When these devices are bombarded with neutrons, the reduced carrier lifetimes result in a decreased sensitivity to triggering by light and ionizing radiation. The thyristors show some decrease in optical and X-ray sensitivity upon neutron exposure in excess of 1013 n/cm2. At 10 14 n/cm2, there are major reductions in photon sensitivity, and some instability is observed
  • Keywords
    III-V semiconductors; X-ray effects; carrier lifetime; gallium arsenide; neutron effects; semiconductor device testing; thyristors; 18 to 38 V; X-ray sensitivity; breakover voltages; carrier lifetimes; high X-ray dose rates; ionizing radiation; laser light; neutron exposure; optically triggered GaAs thyristors; photon sensitivity; radiation response; semiconductor; two-terminal epitaxial devices; Absorption; Charge carrier lifetime; Gallium arsenide; Ionizing radiation; Laboratories; Neutrons; Optical switches; Photoconductivity; Thyristors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.45417
  • Filename
    45417