Circumvention of radiation-induced noise in CCD and CID imagers

Author

Yates, George J. ; Turko, Bojan T.

Author_Institution

Los Alamos Nat. Lab., NM, USA

Volume

36

Issue

6

fYear

1989

fDate

12/1/1989 12:00:00 AM

Firstpage

2214

Lastpage

2222

Abstract

Measurements of radiation sensitivity for interline-transfer charge-coupled devices (CCDs) and charge-injection devices (CIDs) from irradiation with high-energy photons (⁶⁰Co gamma rays and 3- to 5-MeV end-point bremsstrahlung) and 14-MeV neutrons are presented to establish imager susceptibility in such environments. Results from electronic clearing techniques designed for quick (≈300 μs for the CCDs and ≈10 μs for CIDs) removal (or dumping) of radiation-induced charge from prompt sources are discussed. Application of the techniques coupled with long-persistence (microsecond to millisecond) radiation-to-light converters for image retention are described. Typical data illustrating the effectiveness of charge clearing in removal of radiation noise are included for nanosecond-duration pulsed X-ray/γ-ray doses (50-mrad to 5-rad range) and microsecond-duration neutron fluences approaches 10⁸ n/cm²

Keywords

CCD image sensors; X-ray effects; gamma-ray effects; integrated circuit technology; neutron effects; radiation hardening (electronics); 10 to 300 mus; 5E-2 to 5 rad; ⁶⁰Co; CCDs; CID imagers; CIDs; bremsstrahlung; charge-injection devices; electronic clearing techniques; gamma rays; high-energy photons; imager susceptibility; interline-transfer charge-coupled devices; neutrons; radiation-induced charge; radiation-induced noise; removal of radiation noise; Cameras; Charge coupled devices; Image converters; Ionizing radiation; Neutrons; Optical imaging; Optical scattering; TV; X-ray imaging; X-ray scattering;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.45427

Filename

45427