DocumentCode :
74878
Title :
Multi-resonant capacitive microelectromechanical system switch with high isolation for ultra-wideband applications
Author :
Min Kyu Yoon ; Seong Jong Cheon ; Park, Jae Young
Author_Institution :
Dept. of Electron. Eng., Kwangwoon Univ., Seoul, South Korea
Volume :
8
Issue :
10
fYear :
2013
fDate :
Oct. 2013
Firstpage :
591
Lastpage :
593
Abstract :
A multi-resonant capacitive microelectromechanical system switch with wide bandwidth and high isolation has been successfully designed and fabricated for ultra-wideband applications. To achieve high isolation and wide operation frequency bandwidth, three capacitive shunt-connected membranes and meander-shaped inductors with several inductances were utilised in serial connection. Moreover, for achieving a large `ON´/`OFF´ capacitance ratio, a high dielectric aluminium nitride (AlN) film was applied. The measured dielectric relative constant and tangent loss of the AlN film were 8.8 and 0.008, respectively. The capacitive switch has the `ON´/`OFF´ capacitance ratio of 59.6 with the measured capacitances of 52 fF and 3.1 pF at `ON´ and `OFF´ states, respectively. The three resonant frequencies were formed at 4, 5 and 6.5 GHz, and the isolation performances were over 30 dB at the frequencies ranging from 5 to 10 GHz and 70 dB at 6.5 GHz. The size of the fabricated switch was ~1.4 × 1.7 × 0.0083 (height) mm3.
Keywords :
aluminium compounds; capacitance; dielectric losses; high-k dielectric thin films; inductance; inductors; membranes; microfabrication; microswitches; permittivity; AlN; AlN film; capacitive shunt-connected membranes; dielectric relative constant; frequency 4 GHz to 10 GHz; high dielectric aluminium nitride film; inductances; isolation performances; meander-shaped inductors; multiresonant capacitive microelectromechanical system switch; off state; on state; on/off capacitance ratio; resonant frequencies; serial connection; tangent loss; ultrawideband applications; wide operation frequency bandwidth;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2013.0302
Filename :
6651452
Link To Document :
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