XPAD: pixel detector for material sciences

Author

Basolo, S. ; Bérar, J. -F ; Boudet, N. ; Breugnon, P. ; Caillot, B. ; Clemens, J.-C. ; Delpierre, P. ; Dinkespiler, B. ; Koudobine, I. ; Meessen, C. ; Menouni, M. ; Mouget, C. ; Pangaud, P. ; Potheau, R. ; Vigeolas, E.

Author_Institution

CPPM-IN2P3, Marseille, France

Volume

52

Issue

5

fYear

2005

Firstpage

1994

Lastpage

1998

Abstract

Currently available 2D detectors do not make full use of the high flux and high brilliance of third generation synchrotron sources. The XPAD prototype, using active pixels, has been developed to fulfil the needs of materials science scattering experiments. At the time, its prototype is build of eight modules of eight chips. The threshold calibration of ≈4 10⁴ pixels is discussed. Applications to powder diffraction or SAXS experiments prove that it allows to record high quality data.

Keywords

X-ray scattering; nuclear electronics; photon counting; position sensitive particle detectors; powder technology; 2D detectors; SAXS experiments; XPAD photon counting detector; XPAD prototype; active pixel detector; eight chip modules; high flux; material science scattering experiments; powder diffraction; third generation synchrotron sources; threshold calibration; Detectors; Diodes; Electromagnetic scattering; Materials science and technology; Optoelectronic and photonic sensors; Particle scattering; Powders; Prototypes; Switches; Synchrotrons; Detector; SAXS; pixel; powder diffraction; synchrotron;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2005.856818

Filename

1546542