DocumentCode
750489
Title
Silicon Optical Nanocavities for Multiple Sensing
Author
Png, Ching Eng ; Lim, Soon Thor
Author_Institution
Inst. of High Performance Comput., Agency of Sci. & Technol., Singapore
Volume
26
Issue
11
fYear
2008
fDate
6/1/2008 12:00:00 AM
Firstpage
1524
Lastpage
1531
Abstract
This paper investigates an optical nanocavity sensor based on a 1D photonic bandgap. The sensor is unique in that it provides high -factor (sensitivity), and low attenuation and wavelength variation. It incorporates an optical splitter/combiner structure in realizing multiple sensing. Active sensing can be achieved by implementing a p-i-n diode. The optical diode requires an on state power of 81 nW with rise and fall times of 0.2 ns and 0.043 ns, respectively. The sensitivity of the active sensor, at 120, is a magnitude higher than conventional surface sensing and is characterized with respect to the optical phase change and by the diode biasing voltage. It will be shown that the aspect of multiple sensing, resonant wavelengths, the Q-factor and transmission can be optimized by tuning the length of the cavity and the radius of the two innermost air holes. This method allows ease of fabrication by not having to vary the waveguide width and height to obtain tuning effects.
Keywords
nanotechnology; optical sensors; p-i-n diodes; photonic band gap; 1D photonic bandgap; active sensing; active sensor; air holes; diode biasing voltage; multiple sensing; optical combiner; optical diode; optical nanocavity sensor; optical phase change; optical splitter; p-i-n diode; phase modulation; power 81 nW; silicon optical nanocavities; silicon photonics; surface sensing; wavelength variation; Optical attenuators; Optical sensors; Optical surface waves; Optoelectronic and photonic sensors; P-i-n diodes; Photonic band gap; Resonance; Sensor phenomena and characterization; Silicon; Voltage; Nanocavities; optical sensor; phase modulation; photonic bandgap; silicon photonics;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2008.923647
Filename
4542941
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