• DocumentCode
    751636
  • Title

    Embedded timing analysis: a soc infrastructure

  • Author

    Tabatabaei, Sassan ; Ivanov, André

  • Author_Institution
    Vector 12 Corporation
  • Volume
    19
  • Issue
    3
  • fYear
    2002
  • Firstpage
    22
  • Lastpage
    34
  • Keywords
    Circuit testing; Delay effects; Delay estimation; Frequency measurement; Jitter; Sampling methods; Signal resolution; Time domain analysis; Time measurement; Timing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2002.1003786
  • Filename
    1003786
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=751636