Title :
Design for debug: catching design errors in digital chips
Author :
Vermeulen, Bart ; Goel, Sandeep Kumar
Author_Institution :
Philips Research Laboratories
Keywords :
Application software; Clocks; Debugging; Design engineering; Manufacturing; Observability; Pins; Silicon; System-on-a-chip; Testing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2002.1003792
