• DocumentCode
    752005
  • Title

    Built-in current testing

  • Author

    Maly, Wojciech ; Patyra, Marek

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    27
  • Issue
    3
  • fYear
    1992
  • fDate
    3/1/1992 12:00:00 AM
  • Firstpage
    425
  • Lastpage
    428
  • Abstract
    Built-in current (BIC) testing has proven to be useful through a number of IC fabrication experiments. In this paper the experience gained from these experiments is summarized
  • Keywords
    CMOS integrated circuits; built-in self test; integrated circuit testing; CMOS ICs; IC fabrication experiments; built-in current testing; system partitioning; CMOS technology; Circuit faults; Circuit testing; Design optimization; Electrical fault detection; Fabrication; Fault detection; Hardware; Integrated circuit testing; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.121566
  • Filename
    121566
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=752005