Title :
Thin Crack Modeling in ECT With Combined Potential Formulations
Author :
Choua, Y. ; Santandrea, L. ; Le Bihan, Y. ; Marchand, C.
Author_Institution :
Univ. Pierre et Marie Curie, Gif-sur-Yvette
fDate :
4/1/2007 12:00:00 AM
Abstract :
The finite-element modeling of thin cracks in eddy-current testing (ECT) using a-psi and t-phi combined vector-scalar potential formulations is presented with edge and nodal Whitney element discretization. The crack is treated as a nonconductive surface on which appropriate conditions are applied. Several benchmark problems have been solved
Keywords :
eddy current testing; finite element analysis; surface cracks; surface treatment; ECT; combined potential formulations; combined vector-scalar potential formulations; eddy current testing; finite element modeling; nodal Whitney element discretization; nonconductive surface; thin crack modeling; Benchmark testing; Current density; Deformable models; Electric potential; Electrical capacitance tomography; Finite element methods; Insulation; Power system modeling; Surface cracks; Surface treatment; Crack detection; eddy-current testing; finite-element method (FEM);
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2007.892523
