• DocumentCode
    75274
  • Title

    A Study on Network Analyzer Self-Calibration Using an Arbitrary Device

  • Author

    Chih-Jung Chen

  • Author_Institution
    Dept. of Commun., Navig., & Control Eng., Nat. Taiwan Ocean Univ., Keelung, Taiwan
  • Volume
    62
  • Issue
    9
  • fYear
    2013
  • fDate
    Sept. 2013
  • Firstpage
    2576
  • Lastpage
    2582
  • Abstract
    This paper studies the feasibility of calibrating a vector network analyzer with an arbitrary device serving as a calibration standard. The short-open-load-reciprocal and thru-attenuator-network (TAN) procedures are, respectively, extended to develop short-open-load-device and thru-attenuator-device algorithms. The developed algorithms eliminate the limitations and broaden the applicable range of the thru-open-load-reciprocal and TAN procedures by using the device under test as a transfer standard. To benchmark the developed algorithms against the thru-reflect-line algorithm, experiments are conducted with a nonreciprocal device having theoretically symmetrical reflections. Results of the experiments verify the applicability of the developed algorithms.
  • Keywords
    calibration; network analysers; transfer standards; TAN; arbitrary device; device under test; nonreciprocal device; self-calibration standard; short-open-load-device algorithm; short-open-load-reciprocal procedure; thru-attenuator-device algorithm; thru-attenuator-network procedure; thru-reflect-line algorithm; transfer standard; vector network analyzer; Scattering parameters; self-calibration; short-open-load-reciprocal; thru-attenuator-network; thru-line-reflect; vector network analyzer;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2013.2258768
  • Filename
    6519318