• DocumentCode
    752818
  • Title

    NSOM-based characterization method applicable to optical channel waveguide with a solid-state cladding

  • Author

    Ji, Wonsoo ; Kim, Daechan ; Kim, Hyun Jun ; O, Beom-Hoan ; Park, Se-Geun ; Lee, El-Hang ; Lee, Seung Gol

  • Author_Institution
    Sch. of Inf. & Commun. Eng., INHA Univ., Inchon, South Korea
  • Volume
    17
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    846
  • Lastpage
    848
  • Abstract
    A new characterization method employing near-field scanning optical microscope (NSOM) is proposed to measure the propagation characteristics of an optical channel waveguide having a solid-state cladding. For the measurement, the cladding material is replaced with the liquid having the same refractive index as that of the removed cladding. Replacing the solid-state cladding with the liquid enables the NSOM probe to reach the core-cladding interface without changing the boundary condition at the interface. The height of the probe immersed into the viscous liquid is done with the information from the surface profile of the naked core. The measured propagation characteristic shows a good agreement with the simulation result.
  • Keywords
    claddings; near-field scanning optical microscopy; optical waveguides; refractive index; NSOM-based characterization method; core-cladding interface; near-field scanning optical microscope; optical channel waveguide; refractive index; solid-state cladding; Boundary conditions; Optical materials; Optical microscopy; Optical propagation; Optical refraction; Optical variables control; Optical waveguides; Probes; Refractive index; Solid state circuits; Electric field measurement; microscopy; optical waveguides;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2005.844004
  • Filename
    1411896