DocumentCode :
75294
Title :
High-Temperature Single Photon Detection Performance of 4H-SiC Avalanche Photodiodes
Author :
Dong Zhou ; Fei Liu ; Hai Lu ; Dunjun Chen ; Fangfang Ren ; Rong Zhang ; Youdou Zheng
Author_Institution :
Jiangsu Provincial Key Lab. of Adv. Photonic & Electron. Mater., Nanjing Univ., Nanjing, China
Volume :
26
Issue :
11
fYear :
2014
fDate :
1-Jun-14
Firstpage :
1136
Lastpage :
1138
Abstract :
In this letter, the high-temperature performance of 4H-SiC avalanche photodiodes (APDs) working in Geiger mode is studied for the first time. At unity gain bias, the maximum quantum efficiency of the APD increases from 53.4% at 290 nm to 63.3% at 295 nm as temperature rises from room temperature to 150 °C. Meanwhile, the dark current of the APD before breakdown increases by more than two to three orders of magnitude. At a fixed gain of 1.3 × 106, the single photon counting efficiency at 280 nm only slightly drops from 6.17% to 6% in the same temperature range, whereas the dark count rate increases from 22 to 80 KHz. This letter indicates that SiC APDs have the potential to work in a high-temperature harsh environment with single photon counting capability.
Keywords :
avalanche photodiodes; dark conductivity; photon counting; silicon compounds; wide band gap semiconductors; 4H-SiC avalanche photodiodes; Geiger mode; SiC; breakdown; dark current; frequency 22 kHz to 80 kHz; high-temperature harsh environment; high-temperature single photon detection performance; maximum quantum efficiency; single photon counting efficiency; unity gain bias; wavelength 280 nm to 295 nm; Avalanche photodiodes; Dark current; Electric breakdown; Photonics; Silicon carbide; Temperature distribution; Temperature measurement; 4H-SiC; avalanche photodiodes; high temperature; single photon detection;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2014.2316793
Filename :
6787024
Link To Document :
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