DocumentCode :
752951
Title :
Characteristics of waveguide photodetectors at high-power optical input
Author :
Choe, Joong-Seon ; Kwon, Yong-Hwan ; Kim, Kisoo
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Volume :
17
Issue :
4
fYear :
2005
fDate :
4/1/2005 12:00:00 AM
Firstpage :
881
Lastpage :
883
Abstract :
High-power characteristics of waveguide photodetectors (PDs) with various absorbing layer thicknesses were analyzed. When large photocurrent was generated by high-power optical input, the saturation of radio frequency response was closely related with the optical absorption efficiency. The device with a single quantum well absorbing layer showed no saturation behavior until the device failure, while PDs with a thicker absorbing layer were saturated at photocurrent of a few milliamperes. It was also found that as optical confinement decreases, the maximum photocurrent the device can endure increases by more than three times.
Keywords :
optical waveguides; photoconductivity; photodetectors; quantum well devices; absorbing layer thickness; optical absorption efficiency; optical confinement; photocurrent; radio frequency response saturation; single quantum well absorbing layer; waveguide photodetectors; High speed optical techniques; Indium gallium arsenide; Optical control; Optical modulation; Optical saturation; Optical surface waves; Optical waveguides; Photoconductivity; Photodetectors; Radio frequency; Optical confinement factor; photodetector (PD); quantum well; reliability; saturated output;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2005.844003
Filename :
1411908
Link To Document :
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