• DocumentCode
    753148
  • Title

    Ultra-Fast Gain Recovery and Compression Due to Auger-Assisted Relaxation in Quantum Dot Semiconductor Optical Amplifiers

  • Author

    Qasaimeh, Omar R.

  • Author_Institution
    Dept. of Electr. Eng., Jordan Univ. of Sci. & Technol., Irbid, Jordan
  • Volume
    27
  • Issue
    13
  • fYear
    2009
  • fDate
    7/1/2009 12:00:00 AM
  • Firstpage
    2530
  • Lastpage
    2536
  • Abstract
    The ultra-fast gain dynamics in quantum-dot semiconductor optical amplifiers (QD-SOAs) have been studied for different types of Auger-assisted relaxation processes. The ultra-fast gain recovery time and gain compression are studied for p-type doped and un-doped QD-SOAs using rate equation model. Our calculations show that the ultra-fast gain dynamics is governed by electron-electron Auger-assisted process for un-doped QD-SOA and by electron-hole Auger-assisted process for p-type doped (NA=1.25times1018 cm-3) QD-SOA. We find that the ultra-fast gain recovery time for un-doped QD-SOA is comparable with that of p-type doped QD-SOA when both electron hole and electron-electron processes present in the active region. We find that the percentage of ultra-fast gain compression in un-doped QD-SOA is limited to ~ 72%. While for p-type doped (NA=1.25times1018 cm-3) QD-SOA, we find that the percentage of ultra-fast gain compression increases as the applied current increases where it can reach >95% at very high applied current.
  • Keywords
    Auger effect; high-speed optical techniques; laser beams; quantum dot lasers; semiconductor doping; semiconductor optical amplifiers; semiconductor quantum dots; electron-electron Auger-assisted relaxation process; electron-hole Auger-assisted relaxation process; gain compression; p-type doping; quantum dot semiconductor optical amplifier; rate equation model; ultra-fast gain recovery; Auger-assisted dynamics; doping; quantum dot; semiconductor optical amplifier;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2009.2014176
  • Filename
    4840464