• DocumentCode
    753405
  • Title

    Surface Relief Versus Standard VCSELs: A Comparison Between Experimental and Hot-Cavity Model Results

  • Author

    Debernardi, Pierluigi ; Kroner, Andrea ; Rinaldi, Fernando ; Michalzik, Rainer

  • Author_Institution
    Ist. di Elettron. e di Ing. dell´´Inf. e delle Telecomun., Politec. di Torino, Torino
  • Volume
    15
  • Issue
    3
  • fYear
    2009
  • Firstpage
    828
  • Lastpage
    837
  • Abstract
    We present a detailed experimental as well as theoretical study of vertical-cavity surface-emitting lasers (VCSELs) with and without etched surface modifications. The so-called inverted surface relief leads to a suppression of higher-order transverse modes, where measurements of output power and optical spectra show a maximum single-mode output power of 6.1 mW. For simulations, a hot-cavity model is applied, which can handle the complex electrical, thermal, and electromagnetic problems in a VCSEL structure in a fully 3-D manner. The optical characteristics of both structures, including current-dependent output power and spectral properties up to thermal rollover, are very well reproduced by the simulations. Furthermore, the evolution of the beam profile is investigated by simulations as well as spectrally resolved near-field measurements at various distances to the laser surface. Here, the simulations confirm the significantly stronger thermal guiding in the relief device indicated in the measurements.
  • Keywords
    laser beams; laser cavity resonators; laser modes; laser variables measurement; semiconductor device models; spectral analysis; surface emitting lasers; VCSELs; etched surface modification; higher-order transverse mode; hot-cavity model; optical spectra; power 6.1 mW; power measurement; spectrally resolved near-field measurement; thermal rollover property; vertical-cavity surface-emitting laser; Optical near-field; VCSEL; semiconductor laser modeling; surface relief; thermal model; vertical-cavity surface-emitting laser;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2009.2015152
  • Filename
    4840488