• DocumentCode
    753476
  • Title

    Low-frequency FM-noise-induced lineshape: a theoretical and experimental approach

  • Author

    Tourrenc, Jean-Philippe ; Signoret, Philippe ; Myara, Mikhaël ; Bellon, Marc ; Perez, Jean-Philippe ; Gosalbes, Jean-Michel ; Alabedra, Robert ; Orsal, Bernard

  • Author_Institution
    Centre d Electronique et de MicroOptoElectronique de Montpellier, Univ. Montpellier, France
  • Volume
    41
  • Issue
    4
  • fYear
    2005
  • fDate
    4/1/2005 12:00:00 AM
  • Firstpage
    549
  • Lastpage
    553
  • Abstract
    Linewidth determination by self-heterodyne or self-homodyne methods may lead to mistaken interpretation, because these measurements often include significant broadening due to low-frequency FM noise. The effects of FM noise on these linewidth measurement schemes are investigated. An analytical formulation of the photocurrent autocorrelation function is given for different frequency noise signatures, the lineshape being extracted from numerical implementation. We apply these results to linewidth prediction for 850-nm commercial vertical-cavity surface-emitting lasers and get almost perfect agreement between the theoretical and the experimental approaches.
  • Keywords
    laser noise; semiconductor device noise; semiconductor lasers; surface emitting lasers; 850 nm; FM-noise-induced lineshape; linewidth; photocurrent autocorrelation function; self-heterodyne; self-homodyne; vertical-cavity surface-emitting lasers; Autocorrelation; Delay; Frequency; Laser noise; Low-frequency noise; Noise measurement; Optical interferometry; Semiconductor device noise; Surface emitting lasers; Vertical cavity surface emitting lasers; Analytical solution; FM noise; lineshape prediction; vertical-cavity surface-emitting lasers (VCSELs);
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2005.843944
  • Filename
    1411958