DocumentCode
753476
Title
Low-frequency FM-noise-induced lineshape: a theoretical and experimental approach
Author
Tourrenc, Jean-Philippe ; Signoret, Philippe ; Myara, Mikhaël ; Bellon, Marc ; Perez, Jean-Philippe ; Gosalbes, Jean-Michel ; Alabedra, Robert ; Orsal, Bernard
Author_Institution
Centre d Electronique et de MicroOptoElectronique de Montpellier, Univ. Montpellier, France
Volume
41
Issue
4
fYear
2005
fDate
4/1/2005 12:00:00 AM
Firstpage
549
Lastpage
553
Abstract
Linewidth determination by self-heterodyne or self-homodyne methods may lead to mistaken interpretation, because these measurements often include significant broadening due to low-frequency FM noise. The effects of FM noise on these linewidth measurement schemes are investigated. An analytical formulation of the photocurrent autocorrelation function is given for different frequency noise signatures, the lineshape being extracted from numerical implementation. We apply these results to linewidth prediction for 850-nm commercial vertical-cavity surface-emitting lasers and get almost perfect agreement between the theoretical and the experimental approaches.
Keywords
laser noise; semiconductor device noise; semiconductor lasers; surface emitting lasers; 850 nm; FM-noise-induced lineshape; linewidth; photocurrent autocorrelation function; self-heterodyne; self-homodyne; vertical-cavity surface-emitting lasers; Autocorrelation; Delay; Frequency; Laser noise; Low-frequency noise; Noise measurement; Optical interferometry; Semiconductor device noise; Surface emitting lasers; Vertical cavity surface emitting lasers; Analytical solution; FM noise; lineshape prediction; vertical-cavity surface-emitting lasers (VCSELs);
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2005.843944
Filename
1411958
Link To Document